Abstract
We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.
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