Abstract
Spectroscopic ellipsometry (SE), high resolution transmission electron microscopy (HRTEM), atomic force microscopy (AFM) and optical transmittance measurements were used to study and establish a correlation between the open-circuit voltage (Voc) of solar cells and the p-layer optical band gap (Ep). It is found that the ellipsometry measurement can be used as an inline non-destructive diagnostic tool for p-layer deposition in commercial operation. The analysis of ellipsometric spectra, together with the optical transmittance data, shows that the best p-layer appears to be very fine nanocrystallites with an Ep 1.95eV. HRTEM measurements reveal that the best p-layer is composed of nanocrystallites ~9nm in size. It is also found that the p-layer exhibits very good transmittance, as high as ~91.6% at ~650nm. These results have guided us to achieve high Voc value 1.03V for thin film silicon based single junction solar cell.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
