Abstract

AbstractIn this study, the inorganic thin‐film passivation layer was newly adopted to protect the organic light emitting diodes (OLED) from atmospheric moisture and oxygen. Using the electron beam evaporation system, both the various kinds of Na2O and SiO2 based inorganic composite films were deposited onto the poly(ethersulfone) substrate, and their water vapor transmission rates (WVTR) were investigated. The WVTRs as a function of layer thickness were studied and the dependence of the WVTRs as a function of composition rate in composite was also investigated. In this investigation, we can found that the WVTR of SiO2 based composite layer showed the lowest value compared to other inorganic composite layers. Based on this result, we can estimate that the time‐dependent light‐emission properties of OLED will be dramatically enhanced by adopting an inorganic composite layer.

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