Abstract
Mura artifacts reduction (De‐Mura) processing, with a high performance for low grayscales, is developed and integrated in display drivers for active‐matrix organic light‐emitting diode (AMOLED) display. The proposed De‐Mura processing, designed to compensate an AMOLED panel's luminance Mura (L‐Mura) and color Mura (C‐Mura), shows excellent display performance, and the major display properties include a diminished luminance non‐uniformity under low grayscales (<= Gray 16) and low luminous brightness (<= 2 cd/m 2 ), and an improved visually imperceptible color non‐uniformity. Our works reveals an effective solution to work around the inevitable difficulties of optical measurement of AMOLED panels under low luminous brightness.
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