Abstract
Realization of a near‐eye, liquid‐crystal (LC) display with resolution density > 2000 pixels per inch (PPI) is desired but places great demands on the choices of the LC and the thin‐film transistor (TFT) backplane technology. Presently investigated is the requirement placed on the allowable leakage current in the off‐state of a scan transistor in an active‐matrix LC display. With the resolution boosted by the elimination of the storage capacitor, an even more stringent limit is placed on the leakage current. It is concluded that a backplane technology based on metal‐oxide TFTs offering inherently low leakage current enables the construction of a higher‐resolution display. As a demonstration, a 500 PPI display based on deformed‐helix ferroelectric LC and indium‐gallium‐zinc oxide TFTs has been fabricated and characterized.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.