Abstract
Organic light‐emitting diodes (OLEDs) are a widespread commercial display technology but they are still subject of ongoing research with the aim to expand their application ranges through stack and material design. Operational stability is one of the most important key properties that are steadily being improved. The long lifetimes of several thousands of hours of state‐of‐the‐art OLED structures at standard operating conditions demand for accelerated lifetime tests (ALTs) and the use of appropriate scaling laws for elevated temperatures and current densities. Here we present ALTs for a blue thermally activated delayed fluorescent (TADF) OLED and demonstrate the successful determination of the scaling parameters. Moreover, we study the microscopic degradation mechanisms using in‐situ electrical characterization methods.
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