P‐12.4: Starting Performance and Application of Low Temperature Driving Compensation in Super‐large and Ultra‐HD TFT‐LCD of High Frame Rate

Abstract

Low-temperature starting test is an important method to evaluate the reliability of TFT-LCD. In this paper, we studied the problem of low-temperature starting abnormal display (AD) for large-size and high frame rate products, the shift direction of thin film transistor in the GOA area and the shift amount of VGH Margin after aging test are clarified. To solve the AD problem, low temperature compensation using thermistor was applied. The relationship curve between temperature and VGH was measured and simulated. The results show that the shift value of VGH Margin after aging test is 8V in different kinds of products. The relationship between temperature (x) and VGH (y) is y= - 0.244x+40.747. Considering product reliability drift, low temperature compensation technology (parameter settings: temperature ≥0°C, VGH=36V, temperature <–20°C,VGH=42V, can completely solve the AD problem of 75 4K 144Hz. This research is of great significance for predicting the starting performance, thus set the parameters according to the temperature-VGH curve to ensure the reliability of the low-temperature starting, which has important guiding significance for the development of new products.