Abstract
The interaction of oxygen with Rh field emitter surfaces has been investigated by means of field ion microscopy (FIM). It has been found that the field-free exposure of 20 L (1L = 1.3 × 10 -4 Pa⋯s) oxygen to samples at temperatures between 400 and 500 K leads to the reconstruction of individual surface planes. In particular, the stepped Rh{110} and {113} surface planes exhibit “missing-row” or ( n × 2) and ( n × 3 facet structures, whereby n = 1, 2. These structural changes are thermally activated and do not occur at temperatures below 400 K. Stable micrographs with insignificant species desorption during Ne imaging have been obtained after post-dosing 2 L CO to the oxygen-covered surface at cryogenic temperatures.
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