Abstract
XPS has been utilized to study the compositional changes which occur in glass after electron beam irradiation. In the bombarded surfaces a reduction in Na and O signals is observed, while Ca signal shows negligible variations. Two O 1s signals, assigned to bridging and non-bridging oxygen were found. Irradiation causes a decrease of these two types of oxygen. This is at variance with Lineweaver's mechanism which accounts for the decrease of the non-bridging oxygens only. After irradiation a second component in the Si 2p line is found. It has been attributed to the formation of SiSi bonds induced by oxygen outgassing. The formation of these bonds leads to a more compact structure and this might explain the observed density change in irradiated glass.
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