Abstract
Using a thin amorphous layer of SiO 2 (5.2 μg/cm 2) on Si, cross sections for the nuclear reactions 16O(d,p 1) 17O, 16O(d,α) 14N and 16O(α,α) 16O at a laboratory angle of 150° are determined over energies ranging from 0.701 to 1.057 MeV for D + ions and from 2.949 to 3.049 MeV for He + ions. The results are plotted and tabulated as a function of ion energy, with typical uncertainties of 4% for the cross section data and of ±5 keV for the resonance energy. An example for the analysis of atomic displacements on the O sublattice in a Au 2+-irradiated SrTiO 3 single crystal is given.
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