Abstract
The oxidation states of chromium dissolved in binary sodium silicate glasses were analyzed by X‐ray photoelectron spectroscopy (XPS). The measured “equilibrium” Cr6+ fractions in glasses with varying Na2O contents are shown to be in good agreement with results obtained by other techniques reported in the literature. XPS was then used to analyze the interface of a sodium silicate glass/chromium alloy (Inconel 718) seal. It is shown that Cr2+ and Cr3+ were the major chromium species dissolved in the glass interfacial region.
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Schedule a callMore From: Journal of the American Ceramic Society. American Ceramic Society
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