Oxidation State Imaging of Ceria Island Growth on Re(0001)

Abstract

High resolution X-ray photoemission electron microscopy (XPEEM) and low energy electron microscopy (LEEM) have been used to investigate the growth of ultrathin CeOx(111) on Re(0001), a model catalyst system. Rotational domains of CeOx(111) are identified with microprobe low energy electron diffraction (LEED) and dark-field LEEM. In the regions not covered by the ceria islands, a surface rhenium-oxide layer has been observed using energy-filtered XPEEM imaging and spectroscopy. The oxidation state of the ceria is key to its catalytic activity. For this reason we have employed resonant photoelectron spectroscopy of the Ce 4f contributions to the valence band to monitor the relative Ce3+ and Ce4+ concentrations. The overall stoichiometry of the moderately reduced film was CeO1.63. Resonant energy-filtered XPEEM imaging of the Ce oxidation state allowed us to confirm the uniformity of this stoichiometry across the ceria islands that constituted the film.