Abstract
ARXPS, ARUPS, AES, LEED and work-function observations have been used to characterise the oxidation of Nd overlayers and Cu/Nd alloy thin films on a Cu(111) substrate. The effect of thermal processing on the resulting NdO x /Cu systems has also been studied. Valence and core level photoelectron spectra reveal the presence of a new state of chemisorbed oxygen which is formed on top of Nd oxide films at high O 2 exposures. AES and LEED show that Nd overlayers and Cu/Nd alloy thin films are rapidly oxidised at room temperature to form disordered NdO x films; on annealing, these agglomerate and order to form A-type Nd 2O 3.
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