Abstract
A simplified model for evaluation of hot-pressed silicon nitride (HPSN) has been derived which accounts for the amount and type of grain boundary phase and for the composition at the Si 3N 4/oxide reaction interface. The model proved suitable for explaining the oxidation behaviour of a wide range of materials including MgO, CeO 2, (CeO 2 + SiO 2), (Y 2O 3 + SiO 2), (MgO + Y 2O 3) additives. Some deductions are also possible on how to improve the oxidation resistance of HPSN.
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