Abstract
The quality of materials plays a decisive role on the life, performance and the return on investment (ROI) of engineering systems. The photovoltaic systems on-site suffer from climate conditions such as higher temperature, snow fall, humidity, rain, thunder storm, ultraviolet radiations and other environmental gasses and exhibit characteristic degradation. In this paper, we study the effects of oxidation on the degradation of the underlying semiconductor circuitry of the solar panels and the effect of aging on the life of the solar photovoltaic systems. Our research methodology is based on monitoring, testing and evaluating the real time power and efficiency using image analysis.
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