Abstract
Two mechanisms of overwrite, incomplete erasure and modulation, have been studied quantitatively for Co-based thin film longitudinal recording media with a variety of media parameters using thin film head. For all the media studied, the modulation component is larger than the incomplete erasure component under sufficient write current condition. As MrT or the head-medium spacing increases, the incomplete erasure component does not change, instead, overwrite degrades because of the increase in the modulation component. The increase in Hc affects overwrite performance through the increase in both incomplete erasure and modulation component. The relationship between overwrite and media noise performance is also discussed from the view point of media microstructure.
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