Abstract
Today, in material science nanoscale structures are becoming more and more important. Not only for the further miniaturization of semiconductor devices like carbon nanotube based transistors, but also for newly developed efficient energy storage devices, gas sensors or catalytic systems nanoscale and functionalized materials have to be analysed. Therefore, analytical tools like near-edge X-ray absorption fine structure (NEXAFS) spectroscopy has to be applied on single nanostructures. Scanning transmission X-ray microscopes (STXM) as well as full-field transmission X-ray microscopes (TXM) allow the required spatial resolution to study individual nanostructures. In the soft X-ray energy range only STXM was used so far for NEXAFS studies. Due to its unique setup, the TXM operated by the Helmholtz-Zentrum Berlin (HZB) at the electron storage ring BESSY II is the first one in the soft X-ray range which can be used for NEXAFS spectroscopy studies which will be shown in this review. Here we will give an overview of the different microscopes used for NEXAFS studies and describe their advantages and disadvantages for different samples.
Highlights
Several analysis tools and techniques have been developed over the last century to explore electronic and structural properties of materials
Due to its unique setup, the transmission X-ray microscopes (TXM) operated by the Helmholtz-Zentrum Berlin (HZB) at the electron storage ring BESSY II is the first one in the soft X-ray range which can be used for near-edge X-ray absorption fine structure (NEXAFS) spectroscopy studies which will be shown in this review
The full field TXM at the undulator beamline U41-FSGM at the electron storage ring BESSY II operated by the Helmholtz-Zentrum Berlin (HZB) uses a different optical concept [25]: The spectral resolution needed for NEXAFS studies is provided by the monochromator in front of the condenser
Summary
Several analysis tools and techniques have been developed over the last century to explore electronic and structural properties of materials. Due to its unique setup, the TXM operated by the Helmholtz-Zentrum Berlin (HZB) at the electron storage ring BESSY II is the first one in the soft X-ray range which can be used for NEXAFS spectroscopy studies which will be shown in this review. With the availability of synchrotron radiation sources several techniques could be developed having smaller spot sizes which allows studies of the properties of small samples or details of larger materials.
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