Abstract
Recently, there has been an increasing interest in investigating the impact of dual shadowing processes on the performance of wireless fading channels. Conveniently, these dual shadowing processes refer as double shadowed fading channels. In this paper, we provide an outage analysis in double shadowed $\boldsymbol{\kappa}-\boldsymbol{\mu}$ fading channels. In particular, a novel closed-form expression is derived for the outage probability. Furthermore, the truncation error of the results is also provided. Additionally, a closed-form expression for outage probability in double shadowed Rician fading channels is deduced as a special case of double shadowed $\boldsymbol{\kappa}-\boldsymbol{\mu}$ fading channels.
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