Abstract

The effect of dopant, Os(VIII) on the growth process, crystalline perfection and properties of potassium hydrogen phthalate (KHP) single crystals grown by a slow evaporation solution growth technique has been investigated. The XRD analysis of black-colored doped specimen reveals slight structural changes as a result of doping. The SEM images exhibit defect centers and crystal voids. The complex formation of KHP with Os(VIII) is evidenced by the considerable shift in λmax of the doped specimen and enhanced fluorescence intensity is observed by doping. Differential scanning calorimetry (DSC) and TG-DTA studies reveal the purity of the sample and no decomposition is observed up to the melting point. The high resolution X-ray diffraction (HRXRD) studies used to evaluate the crystalline perfection reveal some features on the capability of accommodating the dopant in the crystalline matrix. The diffraction curve (DC) patterns indicate that the high valence transition metal predominantly occupies the interstitial positions and the doping depresses the second harmonic generation (SHG) efficiency owing to the deterioration of crystalline perfection disturbing the charge transfer and nonlinearity.

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