Abstract
A review of the authors' work on orthogonally polarized lasers and their applications in self-sensing metrology is given. Zhang's group at Tsinghua University has been studying orthogonally polarized lasers, their phenomena and applications in metrology. Two kinds of dual frequency HeNe laser, which outputs a beam with two orthogonally polarized components, have been developed including (1) birefringence HeNe lasers (B-lasers) with 40 MHz to 1 GHz frequency difference and (2) birefringence-Zeeman HeNe lasers (BZ-lasers) with ∼0–1 GHz frequency difference. A large number of laser tuning characteristics and feedback effects in HeNe laser and Nd:YAG laser are discovered, which are the basis for utilizing the lasers to realize new sensors for measurement of displacement and phase retardation of optical elements. This paper introduces some original metrology instruments including (1) HeNe laser nanometer rulers, (2) frequency splitting wave-plate measurement system, (3) laser feedback wave-plate measurement system, (4) quasi-common-path Nd:YAG laser feedback interferometer and (5) microchip Nd:YAG laser feedback sensor with birefringence external cavity. These instruments are able to supplement or replace traditional sensors.
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