Abstract
The mechanism of thickness dependence electric properties for BiScO3-PbTiO3 ceramics with morphotropic phase boundary has been investigated. With increasing the sample thickness from 0.2 mm to 1.0 mm, the dielectric constant and piezoelectric coefficient increase by 39% and 36%, respectively, and then become stable with further increase of the sample thickness up to 2.0 mm. Both XRD patterns and Raman spectra show the lattice distortion of tetragonal phase decreases with the thickness. Quantitative analysis of XRD patterns of ceramics with different thicknesses reveal that enhanced electric properties with sample thickness are owing to the improved contributions from lattice distortion, irreversible domain switching and irreversible phase transition from tetragonal to rhombohedral phase with the increases of thickness, which is quite different from the decreased domain size in PMN-PT single crystal. These results not only provide a new mechanism, but also give an important basis for piezoelectric transducer design based on BiScO3-PbTiO3 ceramics.
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