Abstract
The production of etch pits on the basal planes of graphite by oxidizing gases is likely to be due to the presence in the graphite lattice of a variety of defects, the most important of which are line dislocations (edge and screw), impurities as such, condensed point defects, or a combination of these. Results obtained using optical and electron microscope studies of oxidized Ticonderoga graphite crystals are critically assessed in the light of current views regarding the nature of defects in graphite to examine which of the various agencies are likely to be the most important in stimulating the production of etch pits. Evidence is presented to show that condensed vacancy loops and c-axis screws, separately, stimulate pit formation.
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