Abstract
Pb(Fe 0.5Nb 0.5)O 3 (PFN) thin films having a pure perovskite phase were fabricated by a sol–gel technique with post-annealing. The crystallised films were strongly oriented on the SrTiO 3(100) substrate and showed a nano-structured morphology. X-ray diffraction analysis and TEM observations were performed to correlate the preferential orientation with the film structure on the SrTiO 3(100) substrate. XPS was used to analyse the composition of the films. The dielectric constants and loss factors were measured under an applied field from 0.1 to 1000 kHz.
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