Abstract
The crystallography of a Nb/Nb5Si3 lamellar microstructure formed by Nb3Si decomposition has been investigated by transmission election microscopy. Upon solidification of a Nb–10 at.% Ti–20 at.% Si alloy, the high-temperature phase Nb3Si is retained at room temperature. During annealing at 1673 K, the Nb3Si phase transforms into the Nb and Nb5Si3 (D8l) phases with a lamellar microstructure through a eutectoid reaction. The orientation relationship between Nb and Nb5Si3 is determined by selected-area diffraction analyses as , and [133]Nb//[111]Nb5Si3. The present orientation relationship is explained by good atomic matching on the close-packed planes along the near close-packed directions.
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