Abstract
The adsorption of ethylene oxide on Ni(110) was studied at 95 K and monolayer coverage by angle-resolved X-ray photoelectron spectroscopy. A slow radiation-induced decomposition at hv = 1486.7 eV to most likely methoxy was noted. The orientation of the adsorbed ethylene oxide was determined by measuring forward scattering enhancements in the O 1s intensity distribution. Peaks in polar (θ) as well as azimuthal (φ) scans occurred at four angular positions in 2π above the surface: ( θ = 54°, φ = 36°, 144°, 216°, 324°). These positions were evaluated to yield the tilt angle of the molecule at 48°_relative to normal, and the COC bond angle of adsorbed C 2H 4O of about 57°. The molecule is tilted towards the [001] and [001̄] directions (two domains), with a mirror plane in the [001] azimuth.
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