Abstract
A novel microscopy analysis technique is presented, with applications in imaging two-dimensional grains and grain boundaries. The method allows the identification of grain shapes and orientations from large area micrographs, via the moire pattern obtained in a raster image. The observed moire pattern originates from the aliasing between a micrograph’s regular sampling raster and the inherent periodicity of the elements forming the grain under study. The technique presented is very general, allowing grain analysis via many types of microscopy. We demonstrate it in this paper by using Tapping Mode Atomic Force Microscopy and Scanning Electron Microscopy on diblock copolymer thin films.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
