Abstract
Crystal orientation and defect analysis for the commercially important γ-TiAl intermetallic compound is complicated by the near-cubic tetragonality of the L10 TiAl crystal structure. The selected area channeling pattern (SACP) method successfully reveals the γ-TiAl superlattice information, allowing accurate discrimination between the c and a directions that are commonly unattainable by the conventional electron backscattered diffraction (EBSD) method. Combination of this orientation information with crystal defect images obtained via the electron channeling contrast imaging (ECCI) method allows for rapid identification of active deformation systems in individual grains using a trace analysis scheme. Because SACP and ECCI are scanning electron microscopy (SEM) based techniques, analysis can be carried out on regularly shaped macroscopic samples, allowing association of the sample stress state and active defect systems. This has been shown in relation to defect analysis associated with strain transfer at grain boundaries. Additionally, the orientations determined via SACP have been used to correct EBSD data in order to reveal localized rotation due to retained strain within individual grains.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
