Abstract
Lead-free bilayer multiferroic films of CoFe2O4 (CFO) and oriented Bi3.15Nd0.85Ti3O12 (BNT) were deposited on a conventional Pt(111)/Ti/SiO2/Si(100) substrate by use of a sol–gel method. BNT layers with different preferred orientations were grown by use of different spinning and annealing processes. The ferroelectric, ferromagnetic, and magnetoelectric (ME) properties of the CFO–BNT bilayer thin films were investigated at room temperature. a-Axis-oriented bilayer films had larger ME voltage coefficients and larger converse ME response than c-axis-oriented films. This study shows that the orientation of the BNT layer has a stress-mediated interfacial effect which can substantially affect the magnetoelectric coupling behavior of the bilayer structures.
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