Abstract
We report an orientation-controlled FePt thin films grown nonexpitaxially on oxidized Si substrates without using any underlayers. After 700 °C annealing, the FePt single layer with thickness less than 10 nm shows good (001) texture and perpendicular anisotropy. The scanning electron microscope images indicate that these films are composed of isolated islands. For the films thicker than 20 nm, the films become continuous and (111) orientation appears. The transition of film texture relates to the change of morphology of the films. Finally, a theoretical mode based on minimizing surface energy is proposed to explain the texture variation in the films.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
