Abstract

We have developed an aligning technique for polymer crystals and molecular chains utilizing contact-mode atomic force microscopy (AFM). We have aligned lamellar crystals and molecular chains of poly(vinylidenefluoride-trifluoroethylene) thin films. By scanning the film surface using an AFM cantilever tip at the temperature range of 70–100 °C, we aligned the crystals to the scan direction. Moreover, we successfully aligned the molecular chains to the scan direction by scanning at a higher temperature (135 °C). The aligned chains subsequently formed large lamellar crystals, which were still ferroelectric.

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