Abstract
We previously described a two-laser ion trap mass spectrometer for molecular surface analysis of organic, biological, and polymeric surfaces (Kornienko, O.; et al. Anal. Chem. 1997, 69, 1536-1542). We have made several improvements in this instrument: a new 118-nm vacuum ultraviolet (VUV) photoionization source and an improved desorption/ionization geometry in the ion trap. The improved surface analysis capabilities of this instrument are demonstrated on C 18 alkylsiloxane self-assembled monolayers on silicon, polypeptide thin films, mixed polystyrene thin films, and ion beam-modified polystyrene films. The new instrumental configuration has submonolayer sensitivity and the capability to perform tandem mass spectrometry on monolayer samples. The advantages of VUV photoionization for surface analysis studies are demonstrated to be lower fragmentation and relatively nonselective ionization when compared with multiphoton ionization with ultraviolet light.
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