Abstract
As a nonlinear optical system consisting of a Kerr medium inserted in a feedback loop is exposedto a light intensity growing linearly from below to above the threshold for pattern formation, thecritical slowing down around threshold freezes the defect population. The measured number of defectsimmediately after the transition scales with the quench time as predicted by Zurek for a two-dimensionalGinzburg-Landau model. The further temporal evolution of the defect number is in agreement with asimple annihilation model, once the drift of defects specific for our system is taken into account.
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