Abstract
An opto-electronic readout of the memory state in spin transfer torque random access memory (STT-RAM) cells is proposed. A single optical beam illuminating an array of STT-RAM cells creates electrical potential along each STT-RAM cell due to optical rectification that can be further enhanced through plasmon drag effect (PLDE). Then, the photo-induced voltage is assumed to be measured by conventional electronics. Here, a theoretical modeling is performed, where the results provide an estimate of the photo-induced voltage in each memory cell and its variation with respect to the changes in state of the memory cell (parallel vs anti-parallel). Our study shows that the plasmonic enhancement facilitates ${\sim }$ 20 times enhancement in the voltage change due to state change of the each memory cell, compared to the case of out-of-resonance excitation. This enhancement potentially improves the memory readout rate if a proper supporting electronic circuit is available.
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