Optoelectronic Properties of Ce3+ Doped Silicon Oxide and Oxynitride Electroluminescent Devices

Abstract

In this work, we propose a new type of silicon-based electroluminescent device. The thin film emitting layers of the device were deposited using Electron-Cyclotron-Resonance Plasma Enhanced Chemical-Vapor Deposition (ECR-PECVD) with in-situ Ce3+ doping on a P-type silicon substrate. Oxygen was gradually substituted by nitrogen to produce silicon oxynitride thin films with different layer compositions. Refractive indices extracted from variable-angle spectroscopic ellipsometry (VASE) measurements classified the thin films into two main groups, silicon oxide (SiOx) and silicon oxynitride (SiOxNy). The thin film composition was studied by Rutherford Backscattering Spectrometry (RBS), verifying the gradual increase in oxygen content. Photoluminescence (PL) spectroscopy of the emitting layer was obtained using a 375 nm laser as an excitation source. All samples were subjected to the post-deposition annealing treatment for 1 hour at different temperatures varying from 600 to 1200°C in 95% N2 and 5% H2 ambient gas environment, yielding considerably stronger blue PL emission than as-deposited ones. PL intensity of SiOx showed a sudden increase due to the formation of Ce2Si2O7 clusters when annealed at 1200°C. Internal Quantum Efficiency (IQE) and External Quantum Efficiency (EQE) were measured using an integrating sphere and a UV-Vis-NIR spectrometer. The optimum layer composition and annealing condition to produce SiOxNy thin films with maximized Ce3+ excitation efficiency were obtained. To further investigate the electrical performance of the produced samples, the thin films were coated with indium tin oxide (ITO) and aluminum (Al) on the top and bottom side of the thin film respectively. Current-Voltage (I-V) measurements showed improved charge injections in SiOxNy compared to SiOx, due to the reduction of the bandgap upon the incorporation of nitrogen.