Abstract

The author attempts to promote nomenclature standardization, both by describing relevant existing standards, and proposing new terminology where necessary. Nomenclature for radiation and for junction detectors and noncoherent emitters is considered. In the case of radiation, standards have been well established for most of the important radiometric and photometric parameters. The nomenclature originally established primarily for infrared detectors is readily applied to semiconductor junction photodetectors. Semiconductor radiation sources are relatively recent, so the introduction of several new quantities for device characterization is required.

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