Abstract

Observations are presented concerning the effects of coplanar waveguide transmission lines on the propagation of picosecond electrical pulses using an optoelectronic time-domain measurement technique. Effects of various test structure design factors such as substrate thickness, thickness of transmission line metallization, discontinuity spacing, ground plane width, pulser/sampler line length, and pulser/sampler geometry on picosecond electrical pulse propagation in microwave/millimeter wave coplanar waveguide transmission lines are discussed, and schemes for minimizing the adverse effects of each of the above factors are provided. >

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