Abstract
We describe an optoelectronic system to extract gray-scale texture features. These systems utilize a nonlinear resistive grid to perform a 2-D pseudowavelet transform of the optical input image. Texture features are computed using first- and second-order variance estimates of the transform coefficients. Some preliminary results are presented that demonstrate the natural segmentation that the nonlinearity provides at the boundary of two dissimilar textures and the utility of the extracted features for texture discrimination.
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