Abstract

Substantial synthetic vanadium pentoxide (V2O5) nanowires were successfully produced by a vapor-solid (VS) method of thermal evaporation without using precursors as nucleation sites for single crystalline V2O5 nanowires with a (110) growth plane. The micromorphology and microstructure of V2O5 nanowires were analyzed by scanning electron microscope (SEM), energy-dispersive X-ray spectroscope (EDS), transmission electron microscope (TEM) and X-ray diffraction (XRD). The spiral growth mechanism of V2O5 nanowires in the VS process is proved by a TEM image. The photo-luminescence (PL) spectrum of V2O5 nanowires shows intrinsic (410 nm and 560 nm) and defect-related (710 nm) emissions, which are ascribable to the bound of inter-band transitions (V 3d conduction band to O 2p valence band). The electrical resistivity could be evaluated as 64.62 Ω·cm via four-point probe method. The potential differences between oxidation peak and reduction peak are 0.861 V and 0.470 V for the first and 10th cycle, respectively.

Highlights

  • Vanadium pentoxide, V2O5, has been fully exploited in electrochemical energy storage, catalysis and gasochromic coloration [1,2,3,4,5,6,7]

  • The working parameters of this process were as follows: (1) Increasing the working temperature to 800 ̋C with 26 ̋C/min was at a continual flow rate of 30 sccm Ar gas; (2) Maintaining the temperature at 800 ̋C for 1 h was at a constant flow rate of combined gas of 30 sccm Ar and 30 sccm O2; (3) Cooling to the room temperature was under a constant flow rate of 30 sccm of Ar gas

  • The micromorphology and microstructure of one single V2O5 nanowire were further investigated by observation of transmission electron microscope (TEM)

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Summary

Introduction

V2O5, has been fully exploited in electrochemical energy storage, catalysis and gasochromic coloration [1,2,3,4,5,6,7]. V2O5 nanowires were fabricated on silicon substrates, a commercial item with a growth plane of (100), by thermal evaporation.

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