Abstract
This paper presents the optimum stress changing times for 3-step, step stress accelerated life testing under the cumulative exposure model with type-I censoring. The lifetimes of test units are assumed to follow Weibull distribution. The scale parameter of the Weibull failure time at constant stress level is assumed to be a log-quadratic function of the stress level. We derive an optimum test plans to minimize the asymptotic variance of maximum likelihood estimator of given pth percentile of the distribution at a design stress. The optimum test plan based on simulated observations is illustrated through a numerical example. The maximum likelihood estimates and asymptotic interval estimates are obtained using R software.
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