Abstract
This paper investigates the behavior of the surface plasmon polaritons (SPPs) on dielectric-metal interface using Ag thin film on glass substrate. The Kretschman configuration, which is sensitive to the change in the local environment adjacent to Ag thin film, has been modeled using COMSOL Multiphysics, RF module. The graphical presentation for the change in excitation spectra of SPPs on the interface has been analyzed by adjusting the incident angle greater than critical angle of glass while keeping the thickness of Ag thin film constant. The cross-sectional view reveals that the maximum amplitude of electric field occurs at 43° incidence. In order to study the behavior of resonance dip at varying refractive index (from 1.00 to 1.01), the reflection spectra for transverse magnetic (TM) mode of incident light has been extracted using far-field analysis. To further explore the sensitivity and resolution of the device, nm/RIU is collected by using the change in the wavelength (nm) of SPPs for minimum reflection. The remarkably maximum sensitivity of the device has been calculated as 23,000 nm/RI and Q value calculated for Ag-based sensing is 13.
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