Abstract
Novel imaging strategies in the scanning electron microscope aimed at significantly improved image contrast of second phases in metal alloys are described. These include the use of low accelerating voltages, small working distances, and a novel detection system. Contrast is assessed as a function of voltage and optimized imaging conditions which result in much improved image quality are presented. These strategies are applied to two precipitation hardened Ni-base alloys, a cast single crystal and a hot isostatically pressed sample.
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