Abstract
Doping is a common strategy employed to enhance material properties. Numerous researchers have introduced carbon into the nickel oxide (NiO) matrix through various methods to improve the electrochemical performance for energy storage applications. This study investigates the impact of carbon implantation into the NiO matrix using a particle accelerator. Cyclic voltammetry profiles of carbon-implanted NiO (C–NiO) reveal distinct oxidation–reduction peaks, and one side of the CV curves exhibits a rectangular shape, confirming the hybrid capacitive and battery-like behavior of C–NiO. The reduced separation between oxidation–reduction peaks and the increased specific capacitance at higher scan rates validate the capacitive nature of C–NiO. Enhanced electrochemical performance was further explored through GCD, EIS, and BET techniques. C–NiO demonstrates impressive capacitance retention of 93.8 % after 5000 cycles. The Nyquist plot indicates that the improved performance of C–NiO is attributed to its heightened electrode activity, resulting from lower charge-transfer resistance. BET analysis confirms that C-doping leads to a larger surface area. In the NiO matrix, two bands of adsorbed CO2 are observed, whereas these bands are absent in C–NiO, indicating clearer pathways for ion–electron exchange. Compared to undoped NiO (55 F/g at 50 mV/s), C–NiO exhibits a more than tenfold increase in specific capacitance (1079 F/g at 50 mV/s).
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