Optimized variant of the beattie-conn method in the study of the features of the optical properties of nickel in the visible region of the spectrum

Abstract

In a known variant [4] of the Beattie-Conn method, which can be used to find values of the absorption coefficient ~ close to unity, the value of the angle of incidence ~ of radiation onto a reflecting surface and the values of the intensities 19o, 14~, and Io of reflected elliptically polarized light at the azimuths fixed relative to the plane of incidence of the analyzer ~a and the polarizer ~p = 90, 45, and 0 ~ respectively, are measured. Then the parameters of the polarization ellipse are calculated. These parameters are the ratio tan P of the amplitudes of the components of the electric vector of the light wave lying in two mutually perpendicular planes, one of which (usually the plane of incidence, or the p plane) is taken as the reference for measuring the azimuthal angles of the polarization elements, and the phase difference A between the oscillations Of these components. The values of the optical constants n and x are determined on the basis of these ellipsometric parameters according to the equations [4] I