Abstract
SUMMARYThis paper describes modifications made to the objective lens of a Siemens Elmiskop 102 electron microscope which enable a Kevex Si(Li) detector to be brought to within 20 mm of the optic axis, and which give rise to a relatively‘clean’ X‐ray microanalysis system. The modifications do not affect the performance of high resolution, double‐tilt capability of the instrument.
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