Abstract
ABSTRACTThis paper describes nondestructive x-ray characterization techniques which detect macroscopic and microscopic defects, determine the overall crystallographic perfection, and detect any unwanted secondary crystals both on the external surface as well as in the interior of single crystal blades. The method of Asymmetric Crystal Topography for diffraction imaging the surfaces of single crystal turbine blades and the method of White Beam Transmission Topography for diffraction imaging through the thickness of single crystal turbine blades are both discussed and illustrated with representive diffraction images (topographs). It is clear that the images gained from these methods have a capability for providing information about the details of crystalline perfection (or lack thereof) in nickel-based alloy single crystal turbine blades. Such information can provide considerable leverage for the crystal grower to help in adjusting processing variables to enhance quality of a critical product. And the same methods of topography can conceiveably provide tools for evaluating the finished product in a way which has not been available to date.
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