Optimization of three-dimensional scanning process conditions using preference selection index and metaheuristic method

Abstract

Determination of suitable three-dimensional scanning process conditions is of prime importance for quantitative inspection of reverse engineered models. However, it is observed that scanning distance, scanning angle and measuring field are some parameters which are rarely explored during preliminary experimental trials. Therefore, in this paper optimum value for scanning process parameters is determined using the preference selection index (PSI) and metaheuristic methods. The main motivation behind the use of PSI method is that it is a rarely explored multi-criteria decision making (MCDM) technique. In addition, this method does not require assessment of the considered criteria relative significances. For PSI analysis, experimental trials were performed for different scanning conditions using Taguchi L27 orthogonal array. Moreover, an analytical model for prediction of standard deviation of final surface is developed in terms of scanning parameters for PSI prediction. Furthermore, the ANOVA analysis has been employed to establish statistical significance of the developed analytical model. Lastly, a meta-heuristic algorithm namely HTLPSO is used to optimize the PSI model and results are compared with the experimental trials. The adopted integrated methodology of PSI method and metaheuristic algorithm is found to be very helpful in improving the final quality of reverse engineered model.