Abstract
AbstractElemental composition of air particulate matter samples was determined by energy dispersive x‐ray fluorescence technique utilizing in‐house constructed secondary target excitation system. The system, based on 3 kW Mo‐anode x‐ray tube with Ni and Mo secondary targets, was operated in air at atmospheric pressure. The sensitivities of the measurement system were determined for a number of elements in the atomic number range from Z = 13 to Z = 39 (K‐series characteristic radiation) and from Z = 44 to Z = 82 (L‐series characteristic radiation). The results of measurement of reference material samples confirmed that the in‐house constructed system is well suited for analysis of air particulate matter deposits on filter substrate with application of the thin‐layer sample model, with sufficiently good detection limits also for low‐Z elements such as Al, Si, P, S, and Cl.
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