Optimization of Scanning Parameters in Coordinate Metrology Using Grey Relational Analysis and Fuzzy Logic

Abstract

The phenomenon of coordinate measuring machines has led to a significant improvement in accuracy, adaptability, and reliability for measurement jobs. The coordinate measuring machines with scanning capabilities provide the alternative to output precise acquisition at a faster rate. However, they are less accurate as compared to discrete probing systems and slower than the noncontact techniques. Therefore, the data acquisition using a scanning touch probe needs improvement, so that it can provide commendable performance both in terms of accuracy and scanning time. The determination of appropriate scanning parameters is crucial to minimize the inaccuracy and time associated with the scanning process. However, it can be demanding as well as unreliable owing to the presence of uncertainty from a multitude of factors that may influence the measurement process. The optimization of data acquisition using a scanning touch probe is a multiresponse process which involves definite uncertainties from various sources. Therefore, multioptimization tools based on grey relational analysis coupled with principal component analysis and fuzzy logic were employed to enhance the utilization of the scanning touch probe. The work described here has the objective to identify the appropriate combination of scanning factors which can simultaneously boost the accuracy and lessen the scanning time. This study demonstrates the capability and effectiveness of the uncertainty theory based optimization methods in coordinate metrology. It also suggests that the uncertainty associated with the parameter optimization can be significantly reduced using these techniques. It has also been noticed that the results from the two techniques are in accord, which corroborates their application in coordinate metrology. The result from this study can be applied to other probing systems and can be broadened to include more experiments and parameters in various scenarios as needed by the specific application.