Abstract

This paper demonstrates low-resistance and high-transparency p-type contact materials for ultraviolet (UV) micro-light-emitting diodes (LEDs) at 365 nm. As a commonly used p-type LED contact, indium tin oxide (ITO) and nickel/ITO (Ni/ITO) contacts were studied before and after rapid thermal annealing (RTA) treatments. The transmittance at 365 nm wavelength of 200 nm thick ITO films increased from approximately 57%–90% after RTA at a temperature exceeding 400 °C, while the Ni/ITO film had a transmittance of about 73% after annealing. Micron-sized UV-LEDs with Ni/ITO p-contact were fabricated. Electrical characterization shows that Ni/ITO films annealed at 600 °C demonstrated good ohmic contact behavior and the highest on-wafer external quantum efficiency, despite slightly lower transmittance. This paper shows the potential of annealed Ni/ITO films as promising p-contact materials for high-performance 365 nm UV-LEDs.

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