Abstract
X-ray polarimetry with CCD has been performed using a polarized X-ray beam from an electron impact X-ray source. The standard data reduction method employing double-pixel events yields the modulation factor M of 0.14 at 27 keV and 0.24 at 43 keV for the 12 μm pixel size CCD chip. We develop a new data reduction method, in which multi-pixel events are employed, and which approximates the charge spread as an oval shape. We optimize the reduction parameters, so that we improve the P min (minimum detectable polarization degree) by factor of three from the value obtained through the usual double-pixel event method.
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